Dielectric Properties of Fuji Apple Superficial Scald in the 100Hz~3.98MHz Range
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    Abstract:

    The change law of dielectric properties on Fuji apple superficial scald which stored at constant temperature was investigated. The mechanisms that reflected internal quality of fruit using dielectric properties were discussed so as to provide a new theoretical basis for nondestructive inspection and research methods to distinguish between diseased and normal fruits based on electrical properties. The fruits’ dielectric properties, which embraced the impedance, reactance, conductance, capacitance and loss coefficient, were determined with going up frequency from 100Hz to 3.98MHz at (20±1)℃ by applying LCR electronic measure instrument. The results showed that with the frequency increasing, fruit impedance and reactance were decreased; the capacitance and dielectric loss coefficient were changed irregularly, while the conductance was increased in spiral form under same storage times. There was a significantly positive correlation between impedance and reactance, the value of capacitance were significantly different (P<0.01) between the diseased and normal fruits from 100Hz to 3.98MHz. The research revealed that the capacitance could reflect the quality of apples in some extent. 

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